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Foundries, High-k on Program at International Reliability Physics Symposium

The International Reliability Physics Symposium (IRPS), planned for April 26-30 in Montreal, will take up the reliability challenges fabless semiconductor companies face when chips are fabricated at foundries. Other hot topics on the program include high-k dielectric breakdown mechanisms, leakage in compound semiconductors, interconnect failure modes, and electrostatic discharge (ESD) protection.

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